負責人 姓名 饒建奇 學校／系所／職稱 淡江大學/電機工程/助理教授 電話 02-26215656 ext. 2729 電子信箱 jcrau@ee.tku.edu.tw 研究／教學專長 超大型積體電路設計與測試、邏輯合成與最佳化 簡介 Since the design of system-on-a-chip(SOC) involves the reuse intellectual property(IP), IP testing is becoming an important issue. However, the IP user may not know the implementation detail, leading to IP testing is more and more difficult. In this course, we will present some efficient methods for testing IPs so as to increase the testability of the system. 上課大綱 Introduction to SOC and IP SOC Testing Requirements Methodologies of IP Testing DFT of IP Test Access to IP Integration of IP Testing 實習大綱 Implementation of the methodologies of IP Testing. DFT of IP Test Access to IP Integration of IP testing into the SOC testing 預期成果 上年度之成果 (summary) 完成課程教材第一版 開授DIP設計概論課程(91學年度第一學期) 本年度之工作目標 根據上課的過程修改教材的內容, 並擴大涵蓋面與深度 著重舉出實際的例子與應用, 使理論與實務結合